Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2013 | Enhancing the Sensitivity of Molecular Secondary Ion Mass Spectrometry (SIMS) with C60+-O2+ Cosputtering | Liao, Hua-Yang; Lin, Kang-Yi; Kao, Wei-Lun; Chang, Hsun-Yun; Huang, Chih-Chieh; Shyue, Jing-Jong | ANALYTICAL CHEMISTRY 85 [7] 3781-3788 |