Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2008 | Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters | Choi, S. G.; Aspnes, D. E.; Stoute, N. A.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Palmstrøm, C. J. | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 205, 884-7 |