Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2009 | Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching | Mendoza-Galván, Arturo; Järrendahl, Kenneth; Arwin, Hans; Huang, Yi-Fan; Chen, L. C.; Chen, K. H. | APPLIED OPTICS 48, 4996-5004 |