Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2005 | Ratio indicator characterization for measuring the precision of an estimate obtained by processing sampled data | Hao, WD; Jenq, YC; Wang, SY | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 54(3), 1156-1165 |