Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2009 | Spectroscopic ellipsometry analysis of silicon nanotips obtained by electron cyclotron resonance plasma etching | Mendoza-Galván, Arturo; Järrendahl, Kenneth; Arwin, Hans; Huang, Yi-Fan; Chen, L. C.; Chen, K. H. | APPLIED OPTICS 48, 4996-5004 | |||
2021 | Thickness-Dependent Photocatalysis of Ultra-Thin MoS2 Film for Visible-Light-Driven CO2 Reduction | Huang, Yi-Fan; Liao, Kuan-Wei; Fahmi, Fariz Rifqi Zul; Modak, Varad A.; Tsai, Shang-Hsuan; Ke, Shang-Wei; Wang, Chen-Hao; Chen, Li-Chyong; Chen, Kuei-Hsien | Catalysts 11(11):1295 |