Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2006 | Variation of Electronic Structures of CeAl2 Thin Films with Thickness Studied by X-ray absorption near edge structure spectroscopy | Dong, Chung-Li | J. Electron Spectrosc. Relat. Phenom152, 1-2 | |||
2006 | X-ray absorption spectroscopy studies of CeAl2 thin films | Dong, Chung-Li | Applied Surface Science252, 1-2 |