Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2006 | Variation of electronic structures CeAl2 thin film with thickness studies by X-ray absorption near-edge structure spectroscopy | Dong, C. L.; Asokan, K.; Chen, C. L.; Chang, C. L.; Lee, P. C.; Chen, P. C.; Chen, Y. Y.; Lee, J. F.; Guo, J. H. | JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA第152卷,頁1-5 |