Issue Date | Title | Author(s) | Relation | scopus | WOS | Fulltext/Archive link |
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2006 | Size dependnet of electronic structure of copper nanoclusters in SiC matrix | Dong, Chung-Li | Chemical Physics Letters422, 1-2 | |||
2009 | Thickness-Dependent Electronic Structure of Intermetallic CeCo2 Nanothin Films Studied by X-ray Absorption Spectroscopy” | Dong, Chung-Li; Chen, Chi-Liang; Asokan, Kandasami; Chang, Ching-Lin; Chen, Yang-Yuan; Lee, Jyh-Fu; Guo, Jinghua | Langmuir25(13), 7568–7572 | |||
2014 | Understanding and tuning electronic structure in modified ceria nanocrystals by defect engineering | Peng, Dong Ze; Chen, Shih-Yun; Chen, Chi Liang; Gloter, Alexandre; Huang, Fei-Ting; Dong, Chung-Li; Chan, Ting-Shan; Chen, Jin-Ming; Lee, Jyh-Fu; Lin, Hong-Ji; Chen, Chien-Te; Chen, Yang-Yuan | Langmuir 30, 10430-10439 | |||
2006 | Variation of Electronic Structures of CeAl2 Thin Films with Thickness Studied by X-ray absorption near edge structure spectroscopy | Dong, Chung-Li | J. Electron Spectrosc. Relat. Phenom152, 1-2 | |||
2006 | X-ray absorption spectroscopy studies of CeAl2 thin films | Dong, Chung-Li | Applied Surface Science252, 1-2 |